Deutsche Mineralogische Gesellschaft

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Introduction to Secondary Ion Mass Spectrometry in the Earth Sciences

1 – 5 September 2025

This short course is intended for PhD students and young researchers who have little or no experience in the field of SIMS technology. 

However, participants will be expected to be familiar with the basics of analytical geochemistry; a general familiarity with EPMA analyses is a prerequisite.  Practical exercises involving the calculation of quantitative results from real measurement data will require a basic knowledge of the Microsoft Excel spreadsheet program.  This course will provide initial contact with SIMS technology and is intended for all students and post-docs and other researchers who wish to use the Potsdam Cameca 1280-HR user facility.  Other analytical geochemists with a general interest in SIMS technology are also welcome to sign-up for the course. Participants will be exposed to all basic aspects of SIMS: fundamentals of vacuum technology, theory of secondary ion generation and matrix effects, data assessment and realistic assessment of this technique's strengths and limitations.  The course syllabus will be distributed at to all participants at the beginning of the course.

NOTE: Participants are required to bring their own laptop with them and should be able to process .xls, .pdf and .jpg files. Laptops must be capable of WLAN access, for which an individual user password will be issued.

More information can be found here.

Kontakt

Prof. Dr. Elena Sturm
sturm.elena at lmu.de

Dr. Marie Gentzmann
marieh6591 at gmail.com

Für Fragen zu den aktuellen Kursangeboten wenden Sie sich bitte an die jeweils dort genannten Ansprechpartner*innen.

Studentische Mitglieder der DMG erhalten bei der Teilnahme an Kursen der DGGV oder DGK die gleiche Reisebeihilfe wie bei Kursen aus dem DMG-Programm.

Rückblick

Rückblick zum DGK/DMG Ph.D. student course “Basics and applications of the Rietveld method”

http://dgk-home.de/rueckblick-zum-dgkdmg-ph-d-student-course-basics-and-applications-of-the-rietveld-method/

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